Continuous observation of polarization effects in thin SC-CVD diamond detector designed for heavy ion microbeam measurement

Continuous irradiation effects on a thin-film diamond detector were investigated for the utilization of these films as a detector for heavy ion microbeams. Temporal signal degradation in the energy spectrum was frequently observed during the focused heavy ion microbeam irradiation. To measure the temporal response to the each ion incidents, focused heavy ion microbeam with different beam fluence rates were irradiated to a single crystal (SC)-CVD diamond film detector with thickness of 50 μm. The responses to each ion were continuously observed and characterized by ion beam-induced charge (IBIC) measurement system. Heavy ions with short penetration path in diamond generate the large difference in mean path of electrons and holes, which is inverted by changing bias polarity. Signal degradation condition was relied on the bias polarity under the irradiation of heavy ions with short penetration length in the diamond. The continuous observation of IBIC signals revealed that temporal degradation in pulse height of signals, so called polarization effects, seems to be mainly caused by the hole trapping in this diamond crystal.