The potential of ion beams for characterization of metal–organic frameworks

Ion scattering has been employed for depth-profiling of metal–organic frameworks (MOFs) to characterize the degree of post-synthetic uptake of [FeFe](mcbdt)(CO)6 (mcbdt = 2,3-dithiolato-benzoic acid). The system investigated consisted of UiO-66 (UiO = University of Oslo) MOF thin films grown on p-type Si wavers in which a molecular proton reduction catalyst [FeFe](mcbdt)(CO)6 was introduced by postsynthetic exchange (PSE). We have characterized samples by Rutherford Backscattering spectrometry (RBS), Time-of-Flight Elastic Recoil Detection analysis (TOF-ERDA) and by Time-of-Flight Medium Energy Ion Scattering (TOF-MEIS). The beam induced sample modification during the analysis has been characterized by Scanning Electron Microscopy (SEM). No detectable sample modification was found for RBS and TOF-MEIS whereas TOF-ERDA had a clear impact in the present experiment. Composition profiles could be obtained and indicated enrichment of catalyst and/or catalyst residual near to and at the sample surface.