Keywords: Berk-ERDA; TOF-ERDA; XPS; GC/IC; 1H NMR; Lithium ion battery
مقالات ISI Berk-ERDA (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
Keywords: Berk-ERDA; RBS; TOF-MEIS; TOF-ERDA; Metal–organic framework; Catalyst
Keywords: Berk-ERDA; Tandem effect; Carbon foil; Time-of-flight; ToF-E; ToF-ERDA
Keywords: Berk-ERDA; Timing gate; Carbon foil time pick-up detector; Time-of-flight; ToF-ERDA; Spectrometer;
Keywords: Berk-ERDA; Solar absorber coatings; High-temperature ageing; Optical properties; Diffusion; TOF-ERDA
Keywords: Berk-ERDA; Amorphous-nanocrystalline silicon; TOF-ERDA; Thin films; PECVD;
Nanoscale etching of III-V semiconductors in acidic hydrogen peroxide solution: GaAs and InP, a striking contrast in surface chemistry
Keywords: Berk-ERDA; Nanoscale etching; GaAs; InP; Reaction mechanisms; Surface chemistry; III-V oxide; AFM; atomic force microscopy; ICP-MS; inductively coupled plasma mass spectrometry; XPS; x-ray photoemission spectrometry; GaAs; gallium arsenide; InP; indium phosphide; To
Sputtering of polished EUROFER97 steel: Surface structure modification and enrichment with tungsten and tantalum
Keywords: Berk-ERDA; EUROFER; Sputtering; Erosion; ToF-MEIS; AFM; ToF-ERDA;
Characterization of ALD grown TixAlyN and TixAlyC thin films
Keywords: Berk-ERDA; ALD; MAX-phases; ToF-ERDA;
Digitizing data acquisition and time-of-flight pulse processing for ToF-ERDA
Keywords: Berk-ERDA; Ion beam analysis; Digitizer; ToF-ERDA; Time-of-flight; Data acquisition;
A simple timestamping data acquisition system for ToF-ERDA
Keywords: Berk-ERDA; Data acquisition; FPGA; ToF-ERDA; LabVIEW; Timestamping
Time-of-flight – Energy spectrometer for elemental depth profiling – Jyväskylä design
Keywords: Berk-ERDA; Ion beam analysis; Time-of-flight; ToF-ERDA; Elemental depth profiling; Timing gate
Energy resolution measurement and application of the F series ORTEC SSB detector in TOF-ERDA spectrometry
Keywords: Berk-ERDA; ORTEC SSB detector-F series; Heavy ions; Energy and mass resolution; TOF-ERDA
Stopping cross sections of atomic layer deposited Al2O3 and Ta2O5 and of Si3N4 for 12C, 16O, 35Cl, 79Br and 127I ions
Keywords: Berk-ERDA; Stopping cross section; Al2O3; Ta2O5; Si3N4; Heavy-ions; 12C; 16O; 35Cl; 79Br; 127I; ALD; TOF-ERDA;
Analysis of nitrogen-doped ion-beam-deposited hydrogenated diamond-like carbon films using ERDA/RBS, TOF-ERDA and Raman spectroscopy
Keywords: Berk-ERDA; Diamond-like carbon; ERDA; TOF-ERDA; Raman spectroscopy; Anode layer source;
Heavy ion energy loss straggling data from Time of Flight stopping force measurements
Keywords: Berk-ERDA; Stopping force; Energy loss straggling; Heavy ions; ToF-ERDA
Depth resolution of TOF-ERDA using a He beam
Keywords: Berk-ERDA; TOF-ERDA; Depth resolution; He beam; Light element analysis
Depth profiling of Al2O3 + TiO2 nanolaminates by means of a time-of-flight energy spectrometer
Keywords: Berk-ERDA; ToF-ERDA; ERD; Depth profiling; Al2O3 and TiO2; Nanolaminate; ALD
Development of a TOF-ERDA measurement system for analysis of light elements using a He beam
Keywords: Berk-ERDA; TOF-ERDA; Light element analysis; Helium beam; Depth resolution
Atomic layer deposition of ytterbium oxide using β-diketonate and ozone precursors
Keywords: Berk-ERDA; 81.15. âz; 71.20.Eh; 78.70.Ck; 78.66.Bz; 68.55.Ln; 68.37.Ps; Atomic layer deposition; Ytterbium oxide; TOF-ERDA; X-ray diffraction; X-ray reflectivity; Refractive index;
ERDA of Ni–Al2O3/SiO2 solar thermal selective absorbers
Keywords: Berk-ERDA; Solar; Absorber; Selective; SEM; ToF-ERDA