کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1682477 1518734 2012 9 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Radiation emission phenomena in bent silicon crystals: Theoretical and experimental studies with 120 GeV/c positrons
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Radiation emission phenomena in bent silicon crystals: Theoretical and experimental studies with 120 GeV/c positrons
چکیده انگلیسی

The radiation emission phenomena in bent silicon crystals have been thoroughly investigated at the CERN SPS-H4 beamline. The incoming and outgoing trajectories of charged particles impinging on a silicon strip crystal have been reconstructed by high precision silicon microstrip detectors. A spectrometer method has been exploited to measure the radiation emission spectra both in volume reflection and in channeling. The theoretical method used to evaluate the photon spectra is presented and compared with the experimental results.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 283, 15 July 2012, Pages 84–92
نویسندگان
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