32Si AMS measurement with ΔE-Q3D method

Accelerator mass spectrometry (AMS) is one of the most promising methods for the measurement of trace amount of 32Si for its advantages of small sample size, short measurement time and extremely high sensitivity. However, the isobaric interference from 32S often badly hinders the AMS measurement of 32Si. The ΔE-Q3D detection technique established in this work brought about an overall suppression factor of larger than 1012 for 32S. As a result, a sensitivity of better than 1 × 10−14 (32Si/Si) has been achieved, based on the measurement of a blank sample.