Surface morphology influence on deuterium retention in beryllium films prepared by thermionic vacuum arc method

In a plasma-confinement device, material eroded from plasma facing components will be transported and re-deposited at other locations inside the reaction chamber. Since beryllium from the first wall of the ITER fusion reactor will be eroded, ionized in the scrape-off layer plasma and finally re-deposited on divertor surfaces flowing along the magnetic field, it is important to study the properties of divertor armour materials (C, W) coated with beryllium.By applying different bias voltages (−200 V to +700 V) to the substrates during deposition, the morphology of the obtained films was modified. The films’ morphology was characterized by means of AFM and SEM, and it was found that the coatings prepared using negative bias voltage at the substrate during deposition are more compact and have a smoother surface compared to the samples prepared with positive bias voltage. The thickness and composition of each film were measured using Rutherford backscattering spectrometry (RBS). A study of deuterium implantation and retention into the prepared films was performed at IPP Garching in the high current ion source.