Keywords: طیف سنجی برگشت رادرفورد (RBS); Granite; Cesium; Diffusion; Rutherford backscattering spectrometry (RBS);
مقالات ISI طیف سنجی برگشت رادرفورد (RBS) (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
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Keywords: طیف سنجی برگشت رادرفورد (RBS); Electron beam annealing (EBA); Desorption; Reduction; Rutherford backscattering spectrometry (RBS);
Effect of annealing on phase sequence and their composition in the Pt-coated Mo system
Keywords: طیف سنجی برگشت رادرفورد (RBS); Phase transformation; Rutherford backscattering spectrometry (RBS); X-ray diffraction (XRD); Transmission electron microscopy (TEM); Energy dispersive spectroscopy (EDS);
High energy ion irradiation induced surface patterning on a SiO2 glass substrate
Keywords: طیف سنجی برگشت رادرفورد (RBS); Surface patterning; Ion irradiation effects; Atomic force microscopy (AFM); Rutherford backscattering spectrometry (RBS);
Growth dynamics of interfacially polymerized polyamide layers by diffuse reflectance spectroscopy and Rutherford backscattering spectrometry
Keywords: طیف سنجی برگشت رادرفورد (RBS); Reverse osmosis; Interfacial polymerization; Polyamide; Diffuse reflectance spectroscopy; Rutherford backscattering spectrometry (RBS); Atomic force microscopy (AFM)
Sputtering and surface topography modification of bismuth thin films under swift 84Kr15+ ion irradiation
Keywords: طیف سنجی برگشت رادرفورد (RBS); SHI irradiation; Electronic stopping; Surface sputtering; Rutherford backscattering spectrometry (RBS); Atomic force microscopy (AFM); X-rays diffraction (XRD)
Modification of a pulsed 14-MeV fast neutron generator to a medium-energy ion accelerator for TOF-RBS application
Keywords: طیف سنجی برگشت رادرفورد (RBS); Medium-energy ion accelerator; Neutron generator; Time-of-flight (TOF); Rutherford backscattering spectrometry (RBS); Pulse;
Physico-chemical and electrochemical characterization of Ti/RhOx–IrO2 electrodes using sol–gel technology
Keywords: طیف سنجی برگشت رادرفورد (RBS); Metal oxide electrode; Scanning electron microscopy (SEM); Rutherford backscattering spectrometry (RBS); X-ray diffraction (XRD); Cyclic voltammetry (CV)
Surface morphology influence on deuterium retention in beryllium films prepared by thermionic vacuum arc method
Keywords: طیف سنجی برگشت رادرفورد (RBS); 28.52.Fa; 52.75.Xx; 81.15.Jj; 68.37.HkThermionic vacuum arc; Beryllium; Rutherford backscattering spectrometry (RBS); Scanning electron microscopy (SEM)
Structural studies of evaporated CoxCr1âx/Si (1Â 0Â 0) and CoxCr1âx/glass thin films
Keywords: طیف سنجی برگشت رادرفورد (RBS); 61.60.âi; 81.30.Dz; 75.70.âi; 82.80.Yc; 68.37.Ps; X-ray diffraction (XRD); CoCr system; Thin films; Rutherford backscattering spectrometry (RBS); Atomic force microscopies (AFM);
An RBS study of thin PLD and MOCVD strontium copper oxide layers
Keywords: طیف سنجی برگشت رادرفورد (RBS); Pulsed laser deposition (PLD); MOCVD; Rutherford Backscattering Spectrometry (RBS); Transparent conductive oxides; Thermal annealing
Study of iridium/germanium interaction in a lateral diffusion couple
Keywords: طیف سنجی برگشت رادرفورد (RBS); Iridium; Germanium; Diffusion couples; Microbeam; Rutherford Backscattering Spectrometry (RBS)
Formation of a well-ordered ultrathin aluminum oxide film on Ni(1 1 1): Determination of its thickness, composition and structure
Keywords: طیف سنجی برگشت رادرفورد (RBS); Nickel; Ultrathin aluminum oxide; Epitaxy; Superstructure; Rutherford backscattering spectrometry (RBS); Nuclear reaction analysis (NRA); Auger electron spectroscopy (AES); Low energy diffraction (LEED);
Amperometric detection of hydrazine by cyclic voltammetry and flow injection analysis using ruthenium modified glassy carbon electrodes
Keywords: طیف سنجی برگشت رادرفورد (RBS); Cyclic voltammetry; Chemically modified electrodes; Ruthenium; Rutherford backscattering spectrometry (RBS); Film thickness; Flow injection analysis
Physico-chemical integrity of nanofiltration/reverse osmosis membranes during characterization by Rutherford backscattering spectrometry
Keywords: طیف سنجی برگشت رادرفورد (RBS); Nanofiltration; Reverse osmosis; Rutherford backscattering spectrometry (RBS); Membrane active layer thickness; Membrane roughness; Membrane elemental composition
Growth of Ni-Al alloys on Ni(1 1 1), from Al deposits of various thicknesses: (II) Formation of NiAl over a Ni3Al interfacial layer
Keywords: طیف سنجی برگشت رادرفورد (RBS); Nickel; Aluminum; Alloys; Growth; Epitaxy; Diffusion; Ion channeling; Rutherford backscattering spectrometry (RBS); Nuclear resonance profiling (NRP); Auger electron spectroscopy (AES); Low energy electron diffraction (LEED); X-ray diffraction (XRD); Atom
Diffusion processes in seeded and unseeded SBT thin films with varied stoichiometry
Keywords: طیف سنجی برگشت رادرفورد (RBS); Surface chemical reaction; Surface diffusion; Rutherford backscattering spectrometry (RBS); Thin film structures; Metal-oxide interfaces; Ferroelectric films;
Leaf elemental analysis in mycorrhizal post oak seedlings
Keywords: طیف سنجی برگشت رادرفورد (RBS); 82.80.Ej; 82.80.Yc; 87.17.EeElemental concentration; Mycorrhizae; Pisolithus tinctorius; Quercus stellata; Rutherford backscattering spectrometry (RBS); Particle-induced X-ray emission (PIXE)
Growth of Ni-Al alloys on Ni(1 1 1): (I) Formation of epitaxial Ni3Al from ultra-thin Al deposits
Keywords: طیف سنجی برگشت رادرفورد (RBS); Nickel; Aluminum; Alloys; Growth; Epitaxy; Ion channelling; Rutherford backscattering spectrometry (RBS); Nuclear resonance profiling (NRP); Auger electron spectroscopy (AES); Low energy electron diffraction (LEED);
Morphological and elemental characterisation with the high-energy ion-nanoprobe LIPSION
Keywords: طیف سنجی برگشت رادرفورد (RBS); 07.81.+a; 78.70.En; 82.80.Yc; 68.55.âa; Ion probe; Particle induced X-ray emission (PIXE); Rutherford backscattering spectrometry (RBS); Thin films;
IBA of iridescent Art Nouveau glass – comparative studies
Keywords: طیف سنجی برگشت رادرفورد (RBS); 78.70.E; 81.05.Kf; 82.80.Yc; 82.80.EjIon beam analysis (IBA); Proton induced X-ray emission (PIXE); Proton induced γ-ray emission (PIGE); Rutherford backscattering spectrometry (RBS); Iridescent Art Nouveau glass; Tiffany; Loetz
Role of Pb for Ag growth on H-passivated Si(1â0â0) surfaces
Keywords: طیف سنجی برگشت رادرفورد (RBS); 78.67.Bf; 82.70.Uv; 82.80.Yc; 81.65.Rv; Ag nanoislands on Si; Surfactant effect in island size reduction; Transmission electron microscopy (TEM); Rutherford backscattering spectrometry (RBS); Hydrogen passivation;