کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1682868 | 1010484 | 2011 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
A setup for probing ultra-short soft X-ray diffraction by means of curved multilayer structures
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: A setup for probing ultra-short soft X-ray diffraction by means of curved multilayer structures A setup for probing ultra-short soft X-ray diffraction by means of curved multilayer structures](/preview/png/1682868.png)
چکیده انگلیسی
We propose an experimental setup allowing for measurement of the whole diffraction curve of a Bragg peak by single pulse exposure where a bended sample is illuminated by a set of parallel pencil beams under locally different angles of incidence. The feasibility is demonstrated probing the 1st order Bragg peak of Ru/B4C multilayers for photon energies close to Boron K-edge. The evaluated optical parameters recorded from bent sample under fixed sample setting equals those obtained from a flat sample using angular dispersive recording. Subsequently our scheme is appropriate for solid state experiment using at high intense femtosecond pulses provided by free-electron laser sources.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 269, Issue 19, 1 October 2011, Pages 2124-2129
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 269, Issue 19, 1 October 2011, Pages 2124-2129
نویسندگان
D. Ksenzov, Ch. Schlemper, A. Davtyan, S. Bajt, F. Schäfers, U. Pietsch,