Planar irregularities of texture and stress field in Ti detected by X-ray diffraction technique

Regardless of the origin of structure irregularities of materials, the recognition of their spatial distribution in a sample or constructing elements is a great research problem. One of the most effective and non-destructive tools used for this purpose is the X-ray diffraction technique, assisted by an appropriate experimental method and data processing. The work presents the results of investigations of planar distribution of crystallographic texture and stress irregularities manifested by changes of diffraction effects registered by the X-ray technique. As an example, the introduced method is tested on a titanium rod after severe plastic deformation process.