کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1684249 1518749 2010 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Depth profiling of fingerprint and ink signals by SIMS and MeV SIMS
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Depth profiling of fingerprint and ink signals by SIMS and MeV SIMS
چکیده انگلیسی

Police institutions currently have no analytical method of knowing whether a fingerprint was deposited before or after the document was written or printed. The suitability of using MeV secondary ion mass spectrometry (i.e. SIMS with an MeV ion beam) to determine the order in which a fingerprint and written text were deposited on paper was therefore investigated. A 10 MeV O4+ beam was used to generate secondary ions from the surface of the samples and to map the molecular fragments from doped fingerprints and inks on paper. The images obtained and the sputtering behaviour of the samples was found to be indicative of the sequence of ink and fingerprint deposits.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 268, Issues 11–12, June 2010, Pages 1929–1932
نویسندگان
, , , , , ,