کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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1685481 | 1010562 | 2008 | 7 صفحه PDF | دانلود رایگان |
Low-energy heavy-ion time-of-flight elastic recoil detection analysis (TOF-ERDA) is becoming a mature technique for accurate characterization of thin films. In combination with a small tandem accelerator (∼2 MV terminal voltage) and beam energies below 20 MeV, it is suitable for routine analysis of key materials in semiconductor technology. In this paper we discuss advantages and drawbacks of low-energy ERDA, compared to high-energy ERDA, in terms of depth and mass resolution, detection efficiency for light elements, sample irradiation damage and quantification accuracy.The results presented are obtained with the time-of-flight telescope recently developed at IMEC. The time-of-flight is measured with timing gates based on electrostatic mirrors and is acquired in coincidence with the energy signal measured by a planar Si detector.
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 266, Issue 24, December 2008, Pages 5144–5150