کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1686510 1518763 2006 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Ion beam analysis of Cs-implanted zirconia and spinel
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Ion beam analysis of Cs-implanted zirconia and spinel
چکیده انگلیسی

Fission products (Cs) were introduced into yttria-stabilized zirconia (YSZ) and magnesium aluminate spinel (MAS) single crystals by room temperature ion implantation. The effect of high-temperature annealing on the depth distribution of implanted species and the surface homogeneity of crystals were investigated by the combination of AFM and RBS using a macro- and a micro-ion beam. The diffusion and release of Cs involve mechanisms which depend on the material and Cs concentration. In YSZ Cs desorbs out of the crystal at lower temperature (∼550 °C) than in MAS (∼850 °C). In YSZ the surface of the sample remains unaltered when Cs desorption occurs, whereas in MAS Cs desorption is accompanied by the exfoliation of the sample surface.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 249, Issues 1–2, August 2006, Pages 326–329
نویسندگان
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