کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1686510 | 1518763 | 2006 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Ion beam analysis of Cs-implanted zirconia and spinel
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
Fission products (Cs) were introduced into yttria-stabilized zirconia (YSZ) and magnesium aluminate spinel (MAS) single crystals by room temperature ion implantation. The effect of high-temperature annealing on the depth distribution of implanted species and the surface homogeneity of crystals were investigated by the combination of AFM and RBS using a macro- and a micro-ion beam. The diffusion and release of Cs involve mechanisms which depend on the material and Cs concentration. In YSZ Cs desorbs out of the crystal at lower temperature (∼550 °C) than in MAS (∼850 °C). In YSZ the surface of the sample remains unaltered when Cs desorption occurs, whereas in MAS Cs desorption is accompanied by the exfoliation of the sample surface.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 249, Issues 1–2, August 2006, Pages 326–329
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 249, Issues 1–2, August 2006, Pages 326–329
نویسندگان
L. Thomé, A. Gentils, S.E. Enescu, H. Khodja, T. Thomé,