کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1686617 | 1010604 | 2006 | 11 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
New program to estimate layer thicknesses from CEMS spectra
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
A new program, named Beatrice, has been developed for the quantitative estimation of layer thicknesses of single- and multilayers on the basis of their CEMS (conversion electron Mössbauer spectroscopy) spectra. The Beatrice program is able to estimate the individual layer thicknesses of multilayers consisting of several homogeneous or mixed nanolayers. The program can also be applied for samples with composition varying continuously with depth, as well as for samples displaying columns of different layer structures. The capability of the program is demonstrated by deriving functional dependences between relative CEMS subspectrum areas and sublayer thicknesses in simple but practically important cases.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 245, Issue 2, April 2006, Pages 528–538
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 245, Issue 2, April 2006, Pages 528–538
نویسندگان
Ferenc Nagy, Zoltán Klencsár,