کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1687730 | 1010682 | 2007 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Focusing high-energy heavy ion microbeam system at the JAEA AVF cyclotron
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Performance of a focusing high-energy heavy ion microbeam system in TIARA facility of JAEA Takasaki was tested for the spatial resolution and for the hitting accuracy at a target. A 260 MeV 20Ne7+ ion beam was successfully extracted from the JAEA AVF cyclotron (K = 110) with the smallest momentum spread (ΔP/P = δ) at present. The beam was focused by the microbeam lens system, and a spatial resolution of 260 MeV 20Ne7+ microbeam was measured from a secondary electron image of a Cu grid which had sharp edges, and the hitting accuracy was estimated using single ion hitting onto a CR-39 film. From those two methods of measurement, both the spatial resolution and the hitting accuracy were evaluated at less than 1 μm.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 260, Issue 1, July 2007, Pages 85–90
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 260, Issue 1, July 2007, Pages 85–90
نویسندگان
Masakazu Oikawa, Takahiro Satoh, Takuro Sakai, Nobumasa Miyawaki, Hirotsugu Kashiwagi, Satoshi Kurashima, Susumu Okumura, Mitsuhiro Fukuda, Watalu Yokota, Tomihiro Kamiya,