کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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1687837 | 1010688 | 2007 | 5 صفحه PDF | دانلود رایگان |
First results on swift heavy ion induced electron emission from solids obtained with a reaction microscope are presented. This advanced technique, which is successfully used since quite some time to study electron ejection in ion–atom collisions, combines the measurement of the time-of-flight of electrons with imaging techniques. A combination of electric and magnetic fields guides the ejected electrons onto a position sensitive detector, which is capable to accept multiple hits. From position and time-of-flight measurement the full differential emission characteristics of up to 10 electrons per single incoming ion can be extracted. As a first example, we show energy spectra, angular distributions and the multiplicity distribution of electrons from impact of Au24+ (11 MeV/u) on a thin carbon foil (28 μg/cm2).
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 258, Issue 1, May 2007, Pages 91–95