کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1688060 | 1010715 | 2006 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Size-dependent structural disorder in nanocrystalline Cu probed by synchrotron-based X-ray techniques
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
Elemental Cu nanocrystals were synthesized in thin film SiO2 by ion implantation and thermal annealing. The local atomic structure and nanocrystal size distribution were investigated by means of extended X-ray absorption fine structure (EXAFS) spectroscopy and small angle X-ray scattering (SAXS), respectively. We quantify the bondlength contraction and increased structural disorder in the nanocrystals as compared to a bulk Cu reference. Both are proportional to the inverse of the nanocrystal diameter, which in turn is proportional to the surface-area-to-volume ratio. In particular we show that a simple liquid-drop model can explain the bondlength contraction and estimate the surface tension of nanocrystalline Cu to be 3.8 ± 0.4 J/m2.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 246, Issue 1, May 2006, Pages 45–49
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 246, Issue 1, May 2006, Pages 45–49
نویسندگان
B. Johannessen, P. Kluth, D.J. Cookson, G.J. Foran, M.C. Ridgway,