Electrical and morphological properties of polystyrene thin films for organic electronic applications

This study investigates the electrical and morphological properties of polystyrene layers in the nanometre thickness range for organic and polymer based electronic applications. The paper aims to providing conduction data and information on trapped charges present in the polystyrene layer, as well as investigating how polystyrene properties change under differing annealing conditions. The maximum dielectric strength was found to be 4.0 MV cm−1, while fixed trapped charge and mobile trapped charge average densities were calculated to be 9.9 × 1011 cm−2 and 2.6 × 1012 cm−2 respectively. Optimum electrical characteristics were obtained at an anneal temperature of 90 °C, which is just below the glass transition temperature for polystyrene.