کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1689485 | 1011230 | 2007 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Thermal annealing effect on the structure, bandgap, and optical constants of Er-Mn oxide thin films
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Thermal annealing effect on the structure, bandgap, and optical constants of Er-Mn oxide thin films Thermal annealing effect on the structure, bandgap, and optical constants of Er-Mn oxide thin films](/preview/png/1689485.png)
چکیده انگلیسی
Thin films of erbium-manganese oxide were grown on glass and p-type Si substrates. The films were thermally pre-annealed at different temperatures ranging from 400 to 1000 °C to produce different crystalline structures and agitate a solid-state reaction. The structural characterisation of the films was carried out by X-ray diffraction (XRD) and energy dispersion X-ray fluorescence (XRF). The XRD investigation shows that the films annealed at 400 °C were amorphous and nanocrystals of ErMnO3 appear under pre-annealing at about 800 °C or more. Mn oxide and Er oxide prevent each other from crystallising alone. The optical properties of the films pre-annealed at different temperatures were studied in the fundamental absorption region of the spectrum in wavelength range 230-800 nm. The spectral complex refractive index, complex optical dielectric constant, and optical bandgap were determined. A modified single-oscillator Forouhi-Bloomer (FB) technique, Wemple-Didomenico (WD) equation, Urbach's relation, Tauc et al. relation, and pointwise unconditioned minimisation approach (PUMA) were used in the analysing of the obtained spectral data.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Vacuum - Volume 81, Issue 9, 25 May 2007, Pages 1101-1108
Journal: Vacuum - Volume 81, Issue 9, 25 May 2007, Pages 1101-1108
نویسندگان
A.A. Dakhel,