کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1691202 | 1011300 | 2008 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
The effects of buffer growth parameters on heteroepitaxial ZnO films grown by pulsed laser deposition
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
The effects of buffer layer deposition conditions on subsequent ZnO epitaxy on sapphire (0001) were examined. An initial ZnO buffer layer improves surface roughness for a wide range of buffer layer growth temperatures and pressures. Changes in buffer layer growth pressure and temperature have a moderate effect on the roughness of subsequent film growth. However, the conditions for buffer layer deposition have a large impact on crystallinity of subsequent films. In particular, the out-of-plane X-ray diffraction rocking curve full-width half-maximum decreased as buffer deposition temperature or O2/O3 pressure increases. Carrier mobility in the subsequent thick ZnO film was enhanced with increase in buffer layer deposition temperature. Carrier concentration decreased with increasing buffer layer deposition pressure.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Vacuum - Volume 82, Issue 11, 19 June 2008, Pages 1259-1263
Journal: Vacuum - Volume 82, Issue 11, 19 June 2008, Pages 1259-1263
نویسندگان
H.S. Kim, F. Lugo, S.J. Pearton, D.P. Norton, F. Ren,