کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1691623 1011323 2006 9 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
SIMS investigations of isotope effects at a processed solid surface
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
SIMS investigations of isotope effects at a processed solid surface
چکیده انگلیسی
A review of the latest research and the new experimental data obtained by the authors on changes in the isotope composition in the near-surface layers of solids in ion scattering processes, ion sputtering, the secondary ion emission, ion implantation, electrolytic saturation by hydrogen isotopes, thermo-diffusion from external source, and chemical solution action is presented. In all these processes appreciable changes in natural isotopic composition of the near-surface layers have been registered. These changes take place among the secondary emitted and reflected particles also. Investigations of these effects have been made by the methods of secondary ion mass spectrometry (SIMS) and secondary ion energy-mass spectrometry (SIEMS). The many-isotopic samples of molybdenum, nickel implanted in copper, various titanium modifications, thin film titanium-aluminum systems and some others have been used. The general regularities in the changes in the isotope composition by different processes are found. Possible mechanisms of these processes are discussed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Vacuum - Volume 81, Issue 2, 20 September 2006, Pages 202-210
نویسندگان
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