Characterization of Nb-doped PZT (65/35/1) ferroelectric thin films deposited by pulsed laser ablation

Using ceramic targets prepared by conventional way, based on the composition Pb0.995(Zr0.65Ti0.35)0.99Nb0.01O3 + 4% mole PbO excess (PZTN), several ferroelectric films were deposited by pulsed laser ablation (PLA) technique on Pt (111) coated Si and MgO (100) substrates, using XeCl (308 nm) excimer laser. X-ray diffraction is used to characterize the produced perovskite phase (rhombohedral phase) as well as to evaluate the secondary phases and to describe the structural changes during annealing. The optical characteristics are measured in the UV–vis–near IR region. Also, ferroelectric hysteresis behaviour has been characterized by CV measurements.