کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1691636 | 1011324 | 2008 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Characterization of Nb-doped PZT (65/35/1) ferroelectric thin films deposited by pulsed laser ablation
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Using ceramic targets prepared by conventional way, based on the composition Pb0.995(Zr0.65Ti0.35)0.99Nb0.01O3 + 4% mole PbO excess (PZTN), several ferroelectric films were deposited by pulsed laser ablation (PLA) technique on Pt (111) coated Si and MgO (100) substrates, using XeCl (308 nm) excimer laser. X-ray diffraction is used to characterize the produced perovskite phase (rhombohedral phase) as well as to evaluate the secondary phases and to describe the structural changes during annealing. The optical characteristics are measured in the UV–vis–near IR region. Also, ferroelectric hysteresis behaviour has been characterized by CV measurements.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Vacuum - Volume 82, Issue 12, 8 August 2008, Pages 1379–1382
Journal: Vacuum - Volume 82, Issue 12, 8 August 2008, Pages 1379–1382
نویسندگان
M. Pereira, I. Boerasu, M.J.M. Gomes,