کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1691833 | 1011343 | 2007 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
XRD and SEM analysis near the diffusion bonding interface of Mg/Al dissimilar materials
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
The microstructure and phase constitution near the diffusion bonding interface of Mg/Al dissimilar materials are studied using a scanning electron microscope (SEM), X-ray diffraction (XRD) and transmission electron microscope (TEM). The test results indicated that an obvious diffusion zone was formed near the Mg/Al interface during the vacuum diffusion bonding. The diffusion transition zone near the interface consists of various MgxAly phases. The transition region on the Mg side mainly consists of Mg crystals, and the new phase formed was the Mg3Al2 phase having a face-centred cubic lattice. This is favorable for improving the combined strength of Mg substrate and diffusion transition zone.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Vacuum - Volume 82, Issue 1, 12 September 2007, Pages 15–19
Journal: Vacuum - Volume 82, Issue 1, 12 September 2007, Pages 15–19
نویسندگان
Yajiang Li, Peng Liu, Juan Wang, Haijun Ma,