Assessment of the Measurement Procedure for Dimensional Metrology with X-ray Computed Tomography

X-ray computed tomography (CT) is a promising technology for quality assurance of industrial parts. However, computed tomography for dimensional metrology is a complex and indirect measurement procedure, whose results depend on a variety of influencing factors. To ensure that a measurement is traceable back to the basic SI units, a statement about the measurement uncertainty has to be given together with the actual measurement result. A generally accepted method for uncertainty evaluation is the use of calibrated workpieces. However, the influencing factors throughout the measurement procedure that contribute to the uncertainty are not quantified individually and remain unknown. The quality and reliability of the measurement, expressed in measurement uncertainty, hereby depends on hard- and software as well as user-set scan parameters. Not only scan parameters, such as current, tube voltage or exposure time, can influence the measurement results, but also surface determination and geometrical evaluation of the measured features add to the measurement uncertainty.In this contribution, the measurement procedure for metrological computed tomography is assessed and influencing factors throughout the different steps in the measurement procedure are identified as well as quantified. The approach is used to analyze the data quality of different measurements with a test object. The CT data are compared to tactile calibration data of the object and an experimental uncertainty evaluation is given.