|کد مقاله||کد نشریه||سال انتشار||مقاله انگلیسی||ترجمه فارسی||نسخه تمام متن|
|1763223||1019989||2016||8 صفحه PDF||سفارش دهید||دانلود رایگان|
The paper presents a new physical model describing the processes in materials and electronic devices under the influence of cosmic rays in microgravity. The model identifies specific features of formation of the area of radiation defects (ARD) in the electronic materials in microgravity. The mechanism of interaction between the ARD and memory modules in microgravity causing malfunction and failure of onboard electronics is considered. The results of failure of memory modules under real conditions are presented.
Journal: Advances in Space Research - Volume 58, Issue 6, 15 September 2016, Pages 1138–1145