کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1763720 | 1020020 | 2015 | 11 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Space radiation environment prediction for VLSI microelectronics devices onboard a LEO satellite using OMERE-TRAD software
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
علوم زمین و سیارات
علوم فضا و نجوم
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![عکس صفحه اول مقاله: Space radiation environment prediction for VLSI microelectronics devices onboard a LEO satellite using OMERE-TRAD software Space radiation environment prediction for VLSI microelectronics devices onboard a LEO satellite using OMERE-TRAD software](/preview/png/1763720.png)
چکیده انگلیسی
Space radiation environment at Low Earth Orbits (LEO) with perigee at 300Â km, apogee at 600Â km altitude having different orbital inclinations was modeled in the form of electrons and protons trapped in Van Allen Earth Radiation Belts (ERBs), heavy ions and protons in Galactic Cosmic Rays (GCRs), and Energetic Solar Particles (ESP) Events during solar maximum period. The co-relation between various shielding thicknesses and particles transport flux was analyzed for this specific orbit. We observed that there is an optimum shield thickness above which the attenuation of the transmitted flux of incident particles is negligible. To estimate the orbit average differential and integral fluxes to be encountered by onboard devices an appropriate radiation environment models were chosen in OMERE-TRAD toolkit and the impact of various shielding thickness for different orbital inclinations on integral Linear-Energy-Transfer (LET) spectra were determined.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Advances in Space Research - Volume 56, Issue 2, 15 July 2015, Pages 314-324
Journal: Advances in Space Research - Volume 56, Issue 2, 15 July 2015, Pages 314-324
نویسندگان
Muhammad Sajid, N.G. Chechenin, Frank Sill Torres, E.U. Khan, Shahrukh Agha,