Microstructural, optical and electrical studies on sol gel derived ZnO and ZnO:Al films

ZnO and ZnO:Al films were deposited onto glass substrates by the sol gel method using spin coating technique. The effects of aluminum dopant on the crystalline structure and orientation of the ZnO films have been investigated by X-ray diffraction (XRD) study. Surface morphology of the films has also been analyzed by a field emission scanning electron microscope (FESEM) and atomic force microscope (AFM). The average optical transmittance values of all the films is over >83% in the visible region. The optical band gap and Urbach energy values of these films were determined. The absorption edge shifted to the lower energy depending on the Al doping level. The shift of absorption edge is associated with shrinkage effect. The electrical conductivity of the ZnO film enhanced with the Al dopant. From the temperature dependence of conductivity measurements, the activation energy of the films was also calculated.

► ZnO and ZnO:Al films were deposited onto glass substrates by the sol gel method.
► The effects of Al dopant on the physical properties of the ZnO films have been investigated.
► The average optical transmittance values of all the films are over 83% in the visible region.
► The shift of absorption edge is associated with shrinkage effect.
► The electrical conductivity of the ZnO film enhanced with the Al dopant.