کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1787671 | 1023449 | 2007 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
The dependence of dielectric properties on the thickness of (Ba,Sr)TiO3 thin films
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
In the dielectric (Ba,Sr)TiO3 thin films, the correlation between the film thickness and the dielectric properties was investigated. The dielectric properties such as the dielectric constant (ε) and dielectric loss (tan δ) were measured using the capacitor geometry. As the film thickness increased, the dielectric constant also increased due to the reduction of the interfacial dead-layer effect. However, the dielectric loss did not show a monotonous variation with the increasing film thickness. It was found that the dielectric loss correlated well with the non-uniform distribution of local strain, as analyzed by X-ray diffraction, according to the Curie–von Schweidler relaxation law.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Current Applied Physics - Volume 7, Issue 2, February 2007, Pages 168–171
Journal: Current Applied Physics - Volume 7, Issue 2, February 2007, Pages 168–171
نویسندگان
Jeongmin Oh, Taeho Moon, Tae-Gon Kim, Chunjoong Kim, Jae Hun Lee, Sang Young Lee, Byungwoo Park,