Magnetoresistance effects associated with various electric conduction mechanisms in nanostructured [C/FeCo]n multilayers

An evolution of magnetoresistance (MR) mechanism with the film structure was discovered in nanostructured [C/FeCo]n thin films fabricated by magnetron sputtering. The discontinuous multilayer nanogranular structure was confirmed by microstructure characterization. As the layer number n increased, the MR value of the film changed from positive to negative. The fitting curves of lnR−T−1/2 and lnR−T−1/4 show that there is a transition of the conduction regime in the temperature range of 2-300 K. The significant different MR effects at various conduction regimes indicated that the type of transport regime plays an important role in MR origin.