Time-interval analysis of beta decay

A time-interval method of beta-decay half-life analysis is described. The method is expected to produce results that are highly accurate (for the given number of events analyzed), regardless of the event rate, nature of the detection-system dead time, and/or extent of the dead time. This was verified by applying the method in a systematic way to an array of simulated data sets characterized by typical as well as extreme combinations of simulation parameters. The results of the analysis are presented and discussed.

► A novel method of beta-decay half-life analysis is described.
► The method requires that event arrival times are measured.
► Accurate results can be obtained in real measurements even when dead time is unknown.
► The method is simple, free of numerical challenges, fast and exact.
► The method was tested at event rates of 102–105 s−1 and dead times up to 512 µs.