کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1827771 1526481 2009 12 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Surface sensitivity of X-ray photoelectron spectroscopy
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم ابزار دقیق
پیش نمایش صفحه اول مقاله
Surface sensitivity of X-ray photoelectron spectroscopy
چکیده انگلیسی
We give an overview of four terms (the inelastic mean free path (IMFP), the effective attenuation length (EAL), the mean escape depth (MED), and the information depth (ID)) that are frequently used (and sometimes misused) in statements on the surface sensitivity of X-ray photoelectron spectroscopy. We give definitions of each term and show how each term is intended for different applications. Misunderstanding of these terms often arises when the complicating effects of elastic scattering of the signal electrons are overlooked. As a result, numerical values of the IMFP, EAL, and MED for a given material and electron energy will generally be different. Values of the EAL, MED, and ID will also depend on the elastic-scattering properties of the sample and the experimental configuration. We give information on sources of data for IMFPs, EALs, and MEDs, and present simple analytical expressions from which EALs, MEDs, and IDs can be determined.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 601, Issues 1–2, 21 March 2009, Pages 54-65
نویسندگان
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