A study of detection schemes in electro-optic sampling technique

Electro-optic sampling (EOS) is a powerful tool for the measurement of the electron beam or THz radiation. A new detection scheme called “near crossed polarizer (NCP)” scheme in the EOS technique is developed to increase the signal-to-noise ratio (SNR) in the experiment. The new detection scheme is studied in detail and the 3D scanning result with electron beam in FLASH is compared with the theoretical result of the detection scheme.