Disintegration rate, gamma-ray emission probabilities and metastable half-life measurements of 67Ga

• A procedure for 4π(PC)β–γ primary standardization of 67Ga is described.
• The experimental extrapolation curve is compared to Monte Carlo simulation.
• Gamma-ray emission probability per decay is determined for nine transitions.
• The 93 keV metastable half-life is determined by three methods.

The procedure for determining the 67Ga disintegration rate by a primary method is described. The proposed triple 4πβ–γ coincidence system consists of a thin window gas-flow 4π proportional counter (PC) coupled to a NaI(Tl) scintillator and a HPGe crystal. Independent pulse height and occurrence time information is provided for the three detector outputs by means of a Software Coincidence System. Separate spectrometry measurements with a n-type reversed electrode coaxial Ge detector (REGe) were performed for obtaining gamma-ray emission probabilities per decay. Accurate values of disintegration rate, gamma-ray emission probabilities and the metastable half-life were achieved.