کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1879607 | 1532130 | 2008 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Design and construction of a new chamber for measuring the thickness of alpha-particle sources
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
تشعشع
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
The thickness of charged-particle emitting sources can be determined by varying the incidence angle of particles using silicon semiconductor detectors. The differences in energy between the peaks for an alpha emission measured with different incident angles are due to the energy loss of alpha particles in the source. These shifts can thus be used to estimate the source thickness. A new detection chamber has been constructed for this purpose. Its advantage is the registration of the alpha particles emitted from a given source using up to three different detectors simultaneously. Monte Carlo simulation was used to help to determine the best measurement conditions and interpret the results.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Radiation and Isotopes - Volume 66, Issues 6â7, JuneâJuly 2008, Pages 804-807
Journal: Applied Radiation and Isotopes - Volume 66, Issues 6â7, JuneâJuly 2008, Pages 804-807
نویسندگان
A. MartÃn Sánchez, M. Jurado Vargas, M.J. Nuevo Sánchez, A. Fernández Timón,