کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1883598 | 1043300 | 2009 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Degradation of carboxylic acids on Y2O3 surface under UV light. Synergism by semiconductors
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موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
تشعشع
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چکیده انگلیسی
Under UV light formic, oxalic, acetic and citric acids undergo degradation on the surface of Y2O3, an insulator. The oxidation of oxalic acid displays first-order kinetics with a linear dependence on light intensity. The photonic efficiency is lower with UV-A light than with UV-C light. While particulate TiO2, ZnO, CuO, Bi2O3 and Nb2O5 individually photocatalyze the oxidation, each semiconductor when present along with Y2O3 shows synergism, indicating interparticle electron-jump from oxalic acid-adsorbed Y2O3 to the band gap-excited semiconductor on collision. The ease of photodegradation of the acids on Y2O3 is as follows: formic>oxalic>acetic>citric.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Radiation Physics and Chemistry - Volume 78, Issue 3, March 2009, Pages 173–176
Journal: Radiation Physics and Chemistry - Volume 78, Issue 3, March 2009, Pages 173–176
نویسندگان
C. Karunakaran, R. Dhanalakshmi, P. Anilkumar,