EDXRF technique: An alternative methodology for measuring LIII subshell absorption edge jump factor and jump ratio of some high Z elements

LIII subshell absorption edge jump factor and jump ratio of elements W, Au and Hg have been measured experimentally using EDXRF technique using X-PIPS Si (Li) detector. 90° reflection geometry has been used to detect the emitted fluorescent L X-rays from the target elements excited by 59.54 keV gamma-rays emitted from 241Am radioactive point source. Measured values of these parameters have been compared with different theoretically calculated values obtained from XCOM (Berger et al., 2005; Chantler et al., 2005). Result shows a fairly good agreement within experimental uncertainty. These parameters have been reported for the first time for aforesaid elements using this methodology.