کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
271968 505009 2010 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Impact of various plasma instabilities on reliability and performance of tokamak fusion devices
موضوعات مرتبط
مهندسی و علوم پایه مهندسی انرژی مهندسی انرژی و فناوری های برق
پیش نمایش صفحه اول مقاله
Impact of various plasma instabilities on reliability and performance of tokamak fusion devices
چکیده انگلیسی

Plasma instability events such as disruptions, resulting runaway electrons, edge-localized modes (ELM), and vertical displacement events (VDE) are mainly the most limiting factor for successful tokamak reactor concept. The plasma-facing components (PFC), e.g., wall, divertor, and limited surfaces of a tokamak as well as coolant structure materials are subjected to intense particle and heat loads and must maintain a clean and stable surface environment between them and the core/edge plasma. This is critical to fusion device performance. Comprehensive research efforts are developed utilizing the HEIGHTS simulation package to study self-consistently various effects of high power transient on material operation/selection. The package consists of several models that integrate different stages of plasma–wall interactions starting from energy release at scrape-off-layer and up to the transport of the eroded debris and splashed wall materials as a result of the deposited energy. The integrated model predicts material loss, PFC lifetime from transients, and effects on core plasma performance. HEIGHTS initial simulation shows that a single event such as a major disruption, VDE, or runaway electron could severely damage the reactor wall and structural materials and disrupt operation for a significant time. HEIGHTS is used to identify safer operating window regimes and upper transient limits that PFC can withstand during various instabilities.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Fusion Engineering and Design - Volume 85, Issues 7–9, December 2010, Pages 1331–1335
نویسندگان
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