کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
280391 1430405 2005 15 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Curvature effects on axially compressed buckling of a small-diameter double-walled carbon nanotube
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی عمران و سازه
پیش نمایش صفحه اول مقاله
Curvature effects on axially compressed buckling of a small-diameter double-walled carbon nanotube
چکیده انگلیسی

The curvature effects of interlayer van der Waals (vdW) forces on axially compressed buckling of a double-walled carbon nanotube (DWNT) of diameter down to 0.7 nm are studied. Unlike most existing models which assume that the interlayer vdW pressure at a point between the inner and outer tubes depends merely on the change of the interlayer spacing at that point, the present model considers the dependence of the interlayer vdW pressure on the change of the curvatures of the inner and outer tubes at that point. A simple expression is derived for the curvature-dependence of the interlayer vdW pressure in which the curvature coefficient is determined. Based on this model, an explicit formula is obtained for the axial buckling strain. It is shown that neglecting the curvature effect alone leads to an under-estimate of the critical buckling strain with a relative error up to −7%, while taking the average radius of two tubes as the representative radius and the curvature effect leads to an over-estimate of the critical buckling strain with a relative error up to 20% when the inner radius downs to 0.35 nm. Therefore, the curvature effects play a significant role in axially compressed buckling problems only for DWNTs of very small radii. In addition, our results show that the effect of the vdW interaction pressure prior to buckling of DWNTs under pure axial stress is small enough and can be negligible whether the vdW interaction curvature effects are neglected or not.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: International Journal of Solids and Structures - Volume 42, Issue 20, October 2005, Pages 5426–5440
نویسندگان
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