Reexamination of the solder ball shear test for evaluation of the mechanical joint strength

Ball shear tests were investigated in terms of the effects of test parameters, i.e., shear height and shear speed, with an experimental and non-linear finite element analysis for evaluating the solder joint integrity of area array packages. Two representative Pb-free solders were examined in this work: Sn–3.5Ag and Sn–3.5Ag–0.75Cu. The substrate was a common solder mask defined (SMD) type with solder bond pad openings of 460 μm in diameter. The microstructural investigations were carried out using scanning electron microscopy (SEM), and the intermetallic compounds (IMCs) were identified with energy dispersive spectrometry (EDS). Shear tests were conducted with the two varying test parameters. It was observed that increasing shear height at a fixed shear speed has the effect of decreasing shear force for both Sn–3.5Ag and Sn–3.5Ag–0.75Cu solder joints, while the shear force increased with increasing shear speed at fixed shear height. Shear heights that were too high had some negative effects on the test results such as unexpectedly high standard deviation values or shear tip sliding from the solder ball. Low shear height conditions were favorable for screening the type of brittle interfacial fractures or the degraded layers in the interfaces.