Endothelial progenitor cells lowering effect and compensative mechanism in electrical burn injury models of rat

This study aimed to investigate the effects of electrical injury on vascular damage and on matrix metalloproteinase (MMPs) levels. Thirty male Wistar albino rats were divided into five groups (n = 6), including a control group (untreated group), a 600 mv electrical burn injury group, a 900 mv electrical burn injury group, a 1200 mv electrical burn injury group, and a 1500 mv electrical burn injury group. Endothelial progenitor cells (EPCs) and circulating endothelial cells (CECs) were analyzed using flow cytometry. The levels of MMP-9, MMP-3, nitric oxide (NO), vascular endothelial growth factor (VEGF), and vascular cell adhesion molecule (VCAM) were assayed using an enzyme linked immunosorbent assay. Levels of EPCs were significantly lower in all electrical burn injury groups compared with the control group (p < 0.05). The levels of NO and VEGF were significantly increased in all electrical burn injury groups compared with the control group (p < 0.05). The levels of MMP-9 were significantly higher in the 1200 mv electrical burn injury group compared with the control group or the 900 mv electrical burn injury group (p < 0.05). There were no significant differences in MMP-3, VCAM, and CECs levels between groups (p > 0.05). This electrical burn injury model shows a significant decrease in endothelial progenitor cells and an increase in VEGF, NO, and MMP-9 as the compensating mechanism.