کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
385696 | 660869 | 2011 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Down syndrome recognition using local binary patterns and statistical evaluation of the system
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
هوش مصنوعی
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
Down syndrome has a private facial view, thus it can be recognized by using facial features. But this is a very challenging problem when the similarity between the faces of people with Down syndrome and not Down syndrome people are considered. Therefore, we used the local binary pattern (LBP) approach for feature extraction which is a very effective feature descriptor. For classification Euclidean distance and Changed Manhattan distance methods are used. In this way, we improved an efficient system to recognize Down syndrome.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Expert Systems with Applications - Volume 38, Issue 7, July 2011, Pages 8690–8695
Journal: Expert Systems with Applications - Volume 38, Issue 7, July 2011, Pages 8690–8695
نویسندگان
Kurt Burçin, Nabiyev V. Vasif,