Worst-case uncertainty measurement in ADC-based instruments

The paper gives formulae for evaluating the uncertainty of measurements (both “direct” and “indirect”) performed through an ADC-based device (like an oscilloscope, a plug-in DAQ board, etc.). The way of modeling the errors and writing the specifications is discussed. The formulae allow one to evaluate the measurement uncertainty with any given level of confidence, including the special case (when applicable) of 100% or “worst-case” uncertainty. The results are intended as a contribution towards a standard way of writing and using ADC specifications.