کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
4570958 1629213 2016 12 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Utilizing portable X-ray fluorescence spectrometry for in-field investigation of pedogenesis
موضوعات مرتبط
مهندسی و علوم پایه علوم زمین و سیارات فرآیندهای سطح زمین
پیش نمایش صفحه اول مقاله
Utilizing portable X-ray fluorescence spectrometry for in-field investigation of pedogenesis
چکیده انگلیسی


• pXRF spectrometers offer instant, rapid in-field total elemental soil analysis.
• In-field pXRF elemental data can be used to calculate geochemical indices.
• pXRF is very effective for verifying soil parent materials in the field.
• pXRF can be used for objectively identifying pedogenic pathways in the field.

In recent years portable X-ray fluorescence (pXRF) spectrometers have been recognised as an in-field tool for soil analyses as they offer rapid, real-time, simultaneous multi-element analysis of soil samples with no or minimal sample preparation. Portable XRF has been used quite extensively to estimate the degree of soil contamination with heavy metals and to measure the concentration of elements in soils that are important for the soil's fertility, but more recently it has also been used to calibrate for a range of soil chemical and physical properties to perform digital soil morphometrics. However, this still relatively new technology also offers an opportunity for soil scientists to investigate processes of pedogenesis in the field, which in turn will complement the in-field descriptions of soils profoundly. Here, we employed a handheld pXRF spectrometer to investigate the pedogenesis pathways and likely parent materials of three different soil types, utilizing elemental concentration data and geochemical indices. Our study site, a property called ‘Nowley’, is situated on the Liverpool Plains in the Spring Ridge district on the North West Slopes of New South Wales, Australia, in one of the most versatile dryland cropping regions of the continent. The variation in soil types and parent materials across the property offers an unique opportunity to study the impact of parent materials and topography on soil formation. A total of three soil pits were excavated to a depth of 1.0 m to expose the lower B horizons. Soil pit faces were then scanned at 0.1 m depth increments starting from the top of the soil profile to the lowest B horizon exposed. Our results show that elemental data acquired in field condition, which are affected by sample heterogeneities and soil moisture content, are comparable to elemental data acquired in air-dried, ground condition, as geochemical index values show similar trends down the soil profile. We found that the use of pXRF is a very effective in-field tool to assess pedogenic pathways and parent material origin, because of the instant computation of weathering indices and elemental ratios. We conclude that pXRF can be applied successfully and readily to study the soil's weathering history and identify processes of soil formation in the field.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: CATENA - Volume 139, April 2016, Pages 220–231
نویسندگان
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