کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
4740844 | 1358610 | 2010 | 8 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: P and S reflection and P refraction: An integration for characterising shallow subsurface P and S reflection and P refraction: An integration for characterising shallow subsurface](/preview/png/4740844.png)
Characterization of shallow structures was performed by using different approaches analysing both P- and S-wave seismic data with different resolution. The refraction tomography provided P and S velocity models of the first 80 m, while the reflection seismic processing gives a reasonable stacking velocity field until 300 m depth for both P- and S-wave data. So, we estimated the Vp/Vs ratio and an empirical relationship between the two velocities. We characterised the shallow layers using tomographic velocity models and the deeper layers using seismic images with different resolution. The seismic images were obtained by conventional CMP reflection seismic processing and by a novel multi-refractor imaging technique.
Research Highlights
► P- and S-wave help to characterize the subsoil.
► Vs variation is related to lithological changes.
► Shallow structures are better resolved by multi-refractor image with respect to the conventional stacking.
Journal: Journal of Applied Geophysics - Volume 71, Issue 4, August 2010, Pages 149–156