کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
4971427 | 1450523 | 2017 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Towards high-sensitive built-in current sensors enabling detection of radiation-induced soft errors
ترجمه فارسی عنوان
به سوی حسگرهای حساس به حساسیت بالا که باعث تشخیص خطاهای نرم افزاری ناشی از تابش می شود
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کلمات کلیدی
سنسورهای کنونی ساخته شده اشتباهات نرم گسل های گذرا، قابلیت اطمینان،
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
چکیده انگلیسی
Soft error resilience is an increasingly important requirement of integrated circuits realized in CMOS nanometer technologies. Among the several approaches, Bulk Built-in Current Sensors (BBICS) offer a promising solution able to detect particle strikes immediately after its occurrence. Principal challenges for its wide application in common designs are area costs and robustness, both directly related to the sensor's sensitivity. Following this requirement, this work presents strategies enabling the design of high-sensitive BBICS. In detail, we are proposing three approaches based on gate voltage control, body biasing, and stack forcing that can be integrated in all state-of-the-art BBICS architectures. In order to verify the feasibility of this approaches, the proposed techniques have been integrated in a modular BBICS realized in a commercial 65Â nm technology. Simulation results indicate an increase of the detection sensitivity by up to factor 6, leading to 17% area overhead, response times around 1Â ns, a negligible power penalty, and high robustness against wide variations of temperature and process parameters.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 78, November 2017, Pages 190-196
Journal: Microelectronics Reliability - Volume 78, November 2017, Pages 190-196
نویسندگان
Raphael de Oliveira Rocha, Frank Sill Torres, Rodrigo Possamai Bastos,