کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
4985574 | 1454760 | 2017 | 20 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Annealing temperature tuned structural and impedance properties of ZnO thin films
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی شیمی
شیمی کلوئیدی و سطحی
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چکیده انگلیسی
Zinc oxide thin films were synthesized using sol-gel spin coating technique. The films were annealed at 250â¯Â°C, 350â¯Â°C, 450â¯Â°C and 600â¯Â°C for 1 h. X-ray diffraction pattern of films showed transition from amorphous to crystalline nature with rise in annealing temperature. Field emission scanning electron microscopy of ZnO films showed absence of granular nature for films with annealing temperature 250â¯Â°C and 350â¯Â°C. High resolution transmission electron microscopy of single grain revealed lattice spacing of 2.8â¯Ã
corresponding to (100) plane of hexagonal ZnO. The impedance spectra of ZnO films was analyzed in terms of parallel RC element which indicated high resistive nature for films annealed at 250â¯Â°C and 350â¯Â°C. The relaxation time was found to be five orders of magnitude higher for films annealed at 250â¯Â°C and 350â¯Â°C compared to films with annealing temperature 450â¯Â°C and 600â¯Â°C, indicating the improvement in crystallinity resulted in improved conduction.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surfaces and Interfaces - Volume 9, December 2017, Pages 228-232
Journal: Surfaces and Interfaces - Volume 9, December 2017, Pages 228-232
نویسندگان
Nanda Shakti, Tapendu Mandal, Asit Prakash, Gangadhar Purohit,