A Raman spectroscopic analysis of thin carbon films deposited onto curved Ti6Al4V substrates with and without silicon adhesion layers

A Raman spectroscopic analysis of thin carbon films deposited onto curved Ti6Al4V substrates with and without silicon adhesion layers

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Diamond and Related Materials - Volume 70, November 2016, Pages 59-64

Jonathan Laumer, Raja S.K. Selvakumar, Stephen K. O'Leary,