A Novel Method to Evaluate the RFID System Reliability

The RFID system application environment may be different, this have huge influence to the RFID system reliability. This paper presents a data-driven model to evaluate the reliability of RFID systems by analyzing the factors that affect RFID system reliability. We construct free-space and semi-closed metal environment two scenarios by using the proposed model to determine the reliable reference parameter range in these scenarios. The experimental results show that the proposed model can evaluate the reliability of RFID system easily and quickly in different application scenarios.