Atomic nature of the Schottky barrier height formation of the Ag/GaAs(001)-2 × 4 interface: An in-situ synchrotron radiation photoemission study

Atomic nature of the Schottky barrier height formation of the Ag/GaAs(001)-2 × 4 interface: An in-situ synchrotron radiation photoemission study

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 393, 30 January 2017, Pages 294-298

Chiu-Ping Cheng, Wan-Sin Chen, Keng-Yung Lin, Guo-Jhen Wei, Yi-Ting Cheng, Yen-Hsun Lin, Hsien-Wen Wan, Tun-Wen Pi, Raymond T. Tung, Jueinai Kwo, Minghwei Hong,