Investigation of the growth conditions on the nano-structure and electrical properties of ZnS chiral sculptured thin films

The electrical resistance measurements of the produced samples showed that the resistance is strongly dependent on the type of the substrate and the initial nucleation, while the structures grown on larger initial nuclei consist of larger void fraction and hence higher resistance. Investigation on the influence of film thickness (number of pitches) on the conductivity of films showed that sculptured thin films have a different behavior/characteristic to the ordinary thin films. The electrical resistance of the said samples was also investigated under UV radiation and it was observed that the film with highest porosity have highest resistance.