TEM study of SrIrO3 thin films with various thicknesses grown on (0Â 0Â 1) SrTiO3 substrates synthesized by pulsed laser deposition

SAED Patterns of the 30 nm SrIrO3 film. (a)-(c) are the SAED patterns taken from three major orthogonal axes. The orientation relationships among three major orthogonal directions are indicated in (d). (e) The schematic atomic structure of orthorhombic SrIrO3.